publication . Other literature type . Article . 1978

Measurements of the mechanical Q of single-crystal silicon at low temperatures

D. F. McGuigan; C. C. Lam; R. Q. Gram; A. W. Hoffman; D. H. Douglass; H. W. Gutche;
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  • Published: 01 Mar 1978
  • Publisher: Springer Science and Business Media LLC
Abstract
Measurements of the mechanical quality factor Q in a single crystal of silicon vs. temperature have been made. A value of 2 × 109 has been measured at T = 3.5K.
Subjects
free text keywords: General Materials Science, Atomic and Molecular Physics, and Optics, Condensed Matter Physics
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