Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards

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Craven, Alan J.; Sala, Bianca; Bobynko, Joanna; MacLaren, Ian;
  • Publisher: Elsevier

Nanometre-sized TixV(1−x)CyNz precipitates in an Fe20%Mn steel matrix with a thickness range from 14 to 40 nm are analysed using DualEELS. Their thicknesses, volumes and compositions are quantified using experimental binary standards and the process used to give robust ... View more
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