publication . Article . 2018

Image charge models for accurate construction of the electrostatic self-energy of 3D layered nanostructure devices

Barker, John R.; Martinez, Antonio;
Open Access English
  • Published: 05 Mar 2018
  • Publisher: IOP Publishing
  • Country: India
Abstract
Efficient analytical image charge models are derived for the full spatial variation of the electrostatic self-energy of electrons in semiconductor nanostructures that arises from dielectric mismatch using semi-classical analysis. The methodology provides a fast, compact and physically transparent computation for advanced device modeling. The underlying semi-classical model for the self-energy has been established and validated during recent years and depends on a slight modification of the macroscopic static dielectric constants for individual homogeneous dielectric regions. The model has been validated for point charges as close as one interatomic spacing to a ...
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