Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal

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Hu, Z. W. ; Thomas, Pam A. ; Gupta, Mool C. ; Risk, William Paul (1995)

A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain- inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.
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