Near-infrared spectroscopic cathodoluminescence imaging polarimetry on silicon photonic crystal waveguides

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Brenny, Benjamin J. M.; Beggs, Daryl M; van der Wel, Ruben E. C.; Kuipers, L.; Polman, Albert;
(2016)

We measure polarization- and wavelength-resolved spectra and spatial emission intensity distributions from silicon photonic crystal waveguides in the near-infrared spectral range using spectroscopic cathodoluminescence imaging polarimetry. A 30 keV electron beam, incide... View more
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    Measurement WG2 at λ0=1425 nm 1.2 0.4 0.8 e-beam position (μm) 1.2

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