A new SOLT calibration method for leaky on-wafer measurements using a 10-term error model

Article English OPEN
Li, Chong; Liu, Chen; Wu, Aihua; Ridler, Nick;
  • Publisher: IEEE

We present a new Short-Open-Load-Thru (SOLT) calibration method for on-wafer S-parameter measurements. The new calibration method is based on a 10-term error model which is a simplified version of the 16-term error model. Compared with the latter, the former ignores all... View more
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