Compressed sensing electron tomography using adaptive dictionaries: a simulation study

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AlAfeef, A.; Cockshott, P.; MacLaren, I.; McVitie, S.;
  • Publisher: IOP Publishing

Electron tomography (ET) is an increasingly important technique for examining the three-dimensional morphologies of nanostructures. ET involves the acquisition of a set of 2D projection images to be reconstructed into a volumetric image by solving an inverse problem. Ho... View more
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