Quantitative microstructure characterization of Ag nanoparticle sintered joints for power die attachment

Article English OPEN
Wang, Yun ; Li, Jianfeng ; Agyakwa, Pearl ; Johnson, Christopher Mark ; Li, Shuguang (2014)

The samples of sintered Ag joints for power die attachments were prepared using paste of Ag nanoparticles at 240 °C and 5 MPa for 3 to 17 minutes. Their microstructural features were quantitatively characterized with scanning elec-tronic microscopy, transmission electron microscopy, X-ray diffraction and image analysis method. The resulting nor-malized thickness, pore size and porosity decreased, and grain size increased with increasing the sintering time. A time dependence of the form t1/n with n close to 2 or 3 can be further derived for the kinetics of the thinning, densification and grain growth within the sintered Ag joints.
  • References (21)
    21 references, page 1 of 3

    [1] Wondrak, W., Held, R., Niemann, E., & Schmid, U. (2001). IEEE T. Ind. Electron., 48, 307 [2] Neudeck, P. G., Okojie, R. S., &Chen, L. Y. (2002), Proceedings of the IEEE, 90, 1065.

    [3] Khan, M. A., Chen, Q., Shur, M. S., Dermott, B. T., Higgins, J. A., Burm, J., Schaff, W. J., & Eastman, L. F. (1997), Solid-State Electron., 41, 1555.

    [4] Cooper, J. A. & Agarwal, A. (2002), Proceedings of the IEEE, 90, 956.

    [5] Sugawara, Y. (2004), J. Mater. Sci., 457.

    [6] Kim, H. K., Liou, H. K., & Tu, K. N. (1995), Appl. Phys. Lett., 66, 2337.

    [7] Arnold, J., McElroy, J., &Gedney, R. Presented (2002), at JISSO/PROTEC Forum 2002.

    [8] Stam, F.A., & Davitt, E. (2001), Microelectro. Reliab., 41, 1815.

    [9] Bai, J. G. ; &Lu, G. Q. (2006), IEEE T Device. Mat. Re., 6, 436.

    [10] Lu, G. Q., Calata, J. N., Zhang, Z., &Bai, J. G. (2004), Proceedings of the IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis (HDP'04), 42.

    [11] Zhang, Z., &Lu, G. Q. (2002), IEEE Trans. Electron. Packag. Manuf. 25, 279.

  • Metrics
    No metrics available
Share - Bookmark