FinFET centric variability-aware compact model extraction and generation technology supporting DTCO

Article English OPEN
Wang, Xingsheng; Cheng, Binjie; Reid, David; Pender, Andrew; Asenov, Plamen; Millar, Campbell; Asenov, Asen;
(2015)
  • Publisher: Institute of Electrical and Electronics Engineers
  • Related identifiers: doi: 10.1109/TED.2015.2463073
  • Subject:
    acm: Hardware_INTEGRATEDCIRCUITS | Hardware_PERFORMANCEANDRELIABILITY

In this paper, we present a FinFET-focused variability-aware compact model (CM) extraction and generation technology supporting design-technology co-optimization. The 14-nm CMOS technology generation silicon on insulator FinFETs are used as testbed transistors to illust... View more
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