Comparison of a CCD and an APS for soft x-ray diffraction

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Stewart, G.; Bates, R.; Blue, A.; Clark, A.; Dhesi, S.S.; Maneuski, D.; Marchal, J.; Steadman, P.; Tartoni, N.; Turchetta, R.;
(2011)

We compare a new CMOS Active Pixel Sensor (APS) to a Princeton Instruments PIXIS-XO: 2048B Charge Coupled Device (CCD) with soft X-rays tested in a synchrotron beam line at the Diamond Light Source (DLS). Despite CCDs being established in the field of scientific imaging... View more
  • References (9)

    [1] P. Magnan, Detection of visible photons in CCD and CMOS: a comparative view, Nucl. Instrum. Meth. A 504 (2003) 199.

    [2] A. Blue et al., Characterisation of Vanilla: a novel active pixel sensor for radiation detection, Nucl. Instrum. Meth. A 581 (2007) 287.

    [3] PIXIS-XO: 2048B, http://www.infim.ro/∼lab180/projects/2007/PNCD2/PN2C/ MICROREXMOS/Princeton Instruments PIXIS XO 2048B RevB0.pdf, (2010).

    [4] S.S. Dhesi et al., The nanoscience beamline (I06) at diamond light source, in 10th International conference on radiation instrumentation, AIP Conf. Proc. 1234 (2010) 311.

    [5] P. Jerram et al., Back-thinned CMOS sensor optimization, in Optical Components and Materials VII, Proc. SPIE Int. Soc. Opt. Eng. 7598 (2010) 759813.

    [6] D. Litwiller, CCD vs. CMoS: facts and fiction, http://www.dalsa.com/public/corp/photonics spectra ccdvscmos litwiller.pdf, Waterloo Canada (2001).

    [7] J.R. Janesick, Photon transfer, SPIE Press, Bellingham U.S.A. (2007).

    [8] European Machine Vision Association, EMVA Standard 1288: standard for characterization of image sensors and cameras, http://www.emva.org/cms/upload/Standards/Stadard 1288/EMVA1288-3.0.pdf, (2010).

    [9] S.E. Bohndiek et al., Comparison of methods for estimating the conversion gain of CMOS active pixel sensors, IEEE Sensors J. 8 (2008) 1734.

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