Comparison of a CCD and an APS for soft x-ray diffraction

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Stewart, G.; Bates, R.; Blue, A.; Clark, A.; Dhesi, S.S.; Maneuski, D.; Marchal, J.; Steadman, P.; Tartoni, N.; Turchetta, R.;

We compare a new CMOS Active Pixel Sensor (APS) to a Princeton Instruments PIXIS-XO: 2048B Charge Coupled Device (CCD) with soft X-rays tested in a synchrotron beam line at the Diamond Light Source (DLS). Despite CCDs being established in the field of scientific imaging... View more
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