Electric field-controlled magnetization in bilayered magnetic films for magnetoelectric memory

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Yang, W.-G. ; Morley, N.A. ; Mark Rainforth, W. (2015)
  • Publisher: American Institute of Physics (AIP)

Bilayered magnetic films (Co<inf>50</inf>Fe<inf>50</inf> (CoFe)/Metglas) were RF sputtered on both (001)-oriented and (011)-oriented PMN-PT (lead magnesium niobate-lead titanate) substrates. Electric field-controlled magnetization changes were observed in all these samples: 65 nm CoFe/24 nm Metglas/(001) PMN-PT, 65 nm CoFe/24 nm Metglas/(011) PMN-PT, and 30 nm CoFe/12 nm Metglas/(011) PMN-PT. The maximum magnetic remanence ratio change (ΔM<inf>r</inf>/M<inf>s</inf>) was 46% for CoFe/Metglas/(001) PMN-PT. In this heterostructure, the electric-field created two new non-volatile switchable remanence states and the as-grown remanence state was altered permanently. High-resolution transmission electron microscopy images show a sharp and smooth interface between Metglas and substrate and conversely a rougher interface was observed between Metglas and CoFe films. In the 30 nm CoFe/12 nm Metglas/(011) PMN-PT sample, a large ΔM<inf>r</inf>/M<inf>s</inf> of 80% along the [100] direction was measured, while the ΔM<inf>r</inf>/M<inf>s</inf> along the [01-1] direction was 60% at the applied electric field of 5 kV/cm, corresponding to a giant magnetoelectric coupling constant α = μ<inf>o</inf>ΔM<inf>r</inf>/E = 2.9 × 10<sup>-6</sup> s/m.
  • References (37)
    37 references, page 1 of 4

    1C. Israel, N. D. Mathur, and J. F. Scott, Nature Mater. 7, 93 (2008).

    2C. Chappert, A. Fert, and F. N. Van Dau, Nature Mater. 6, 813 (2007).

    3D. Barrionuevo, N. Ortega, A. Kumar, R. Chatterjee, J. F. Scott, and R. S.

    Katiyar, J. Appl. Phys. 114, 234103 (2013).

    4M. Bibes and A. Barthelemy, Nature Mater. 7, 425 (2008).

    5J. H. Park, Y. K. Jeong, S. Ryu, J. Y. Son, and H. M. Jang, Appl. Phys.

    Lett. 96, 192504 (2010).

    6M. Liu, O. Obi, J. Lou, Y. J. Chen, Z. H. Cai, S. Stoute, M. Espanol, M.

    Mater. 19, 1826 (2009).

    7Y. Zhang, Z. G. Wang, Y. J. Wang, C. T. Luo, J. F. Li, and D. Viehland, J. Appl. Phys. 115, 084101 (2014).

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