Figure 2. The normalized FTIR absorbance spectra measured in FTIR spectrometer with ATR accessory after low pressure plasma treatment at room temperature (a) and at 500°C (b).Figure 3. IR Raman spectra measured in FTIR spectrometer with 1064 nm laser excitation after low pressure plasma treatment at room temperature (a) and at 500°C (b). Figure 4. C 1s (a), and O 1s (b) XPS spectra (from top to bottom) for the “As received” sample, the samples treated in H2, O2, and N2 plasma at room temperature, annealed in H2, O2, and N2 atmosphere at 500°C, and annealed in H2, O2, and N2 plasma at 500°C. Dots represent measured data, black lines results of fits, colored lines fitting components. Peaks shaded by grey originate from carbon-oxygen contamination.\n\nFigure 5. Ratio of selected components derived from fitting XPS spectra. We use following labels for simplification: BO: Si-O-Si bridging oxygen, NBO: Si-O-M non-bridging oxygen, H2O: oxygen from hydrous species bound to silicon (H2O, Si-OH), CO: carbon-oxygen contaminations (C-O(H), C=O, COOH), C: atomic concentration of carbon normalized to 1. The absolute uncertainty was esti-mated to be of ± 0.2 and not included in the graph for better clarity. It should be noted that a sub-stantial portion of the uncertainty is given by a systematic approach of data analysis (same in all cases) resulting in high reliability of data trends. Figure 6. PL spectra of treated glass powder oxygen plasma. “RT plasma”, resp. “500°C plasma” represents the PL spectra measured after room temperature, resp. 500°C O2 plasma treatment, The PL spectra of as received and annealed at 500°C in O2 atmosphere (no plasma) glass powder were added for comparison. Figure 7. PL spectra of room temperature H2 plasma treated glass powder using sinusoidal UV LED excitation at frequency of 100 kHz (a). The curve with error bars corresponds to the spectrally re-solved mean PL decay time τ calculated from the phase shift between the excitation and the emis-sion spectra. The time resolved PL emission measured by TCSPC at 450 nm is shown in (b). The instrumental response function measured at the excitation pulse wavelength (excitation pulse shape) and fitted curve were added for comparison. All measurements were done at RT.